Published on 22-Jun-2026

Flir and edevis Advance Automated NDT with Integrated MWIR Thermal Imaging Solution

Flir and edevis Advance Automated NDT with Integrated MWIR Thermal Imaging Solution

Sources - @Flir

Flir, a Teledyne company, and edevis GmbH have expanded their collaboration in automated non-destructive testing (NDT), demonstrating an integrated inspection solution that combines Flir’s A6450 cooled MWIR thermal imaging camera with edevis’ active thermography technology to enable real-time detection of structural anomalies in manufacturing environments.

The joint solution is designed to address growing industry demand for faster, more reliable quality assurance processes across sectors such as automotive, energy, and advanced manufacturing. By combining high-speed thermal imaging with active thermography, the system enables full-surface inspection capable of identifying hidden defects that may be missed by conventional point-based inspection methods.

Manufacturers increasingly face challenges related to detecting grinding burns, coating delamination, adhesion failures, and subsurface material irregularities that can affect product performance and reliability. Traditional inspection techniques often focus on limited areas of a component, potentially leaving critical defects undetected. The integrated Flir and edevis solution aims to provide comprehensive inspection coverage while delivering actionable results within seconds.

At the center of the system is the Flir A6450 thermal camera, engineered for continuous industrial operation. The camera features a long-life cooler rated for 27,000 hours and high-speed mid-wave infrared (MWIR) imaging capabilities that support precise temperature measurement and rapid thermal response capture during active thermography inspections.

When integrated with edevis’ laser-based excitation technology and thermography software, the system can reveal structural anomalies that are not visible through standard visual inspection methods and can be difficult to identify using conventional sensors.

“Manufacturers are under increasing pressure to automate more of their quality assurance processes while maintaining absolute reliability,” said Mathew Hasty, Global Vertical Director at Flir. “The A6450 is designed for exactly these environments. Combined with edevis’ active thermography, it delivers real-time insight into structural behavior that helps customers catch defects earlier and keep production moving.”

edevis’ active thermography systems are already deployed for the inspection of metals, composite materials, battery components, and precision-machined parts. The integration of Flir thermal imaging technology enhances the ability to evaluate material behavior under thermal excitation while supporting automated decision-making directly on production lines.

The companies state that the resulting workflow provides a contactless, repeatable, and scalable inspection process suited to modern manufacturing requirements, where throughput, consistency, and defect prevention remain critical priorities.

“Our mission is to make high-precision NDT fully automated, fast, and easy to integrate,” said Alexander Dillenz Managing Director at edevis GmbH. “Flir’s A6450 gives us the thermal performance and long-term stability required for continuous industrial use. Together, we’re enabling manufacturers to detect defects that would otherwise remain hidden and to do so at the speed their production lines demand.”

As manufacturers continue to adopt automated inspection technologies, the combined Flir and edevis solution offers a scalable approach for inspecting components such as brake discs, composite structures, battery cells, and semiconductor devices. By delivering real-time thermal analysis and automated defect detection, the technology supports efforts to improve product integrity, reduce scrap, and enhance production efficiency through advanced non-destructive testing.

Reference: https://timestech.in/flir-and-edevis-advance-real-time-automated-ndt-with-integrated-flir-a6450-mwir-thermal-imaging/

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