Detection Technology has highlighted the growing role of advanced X-ray inspection systems in the defense sector with the continued expansion of its X-Panel XL series of extra-large flat panel detectors. The company stated that the series is designed to address increasing non-destructive testing (NDT) and quality assurance requirements as defense manufacturers scale production of critical systems and components.
The demand for inspection technologies is rising across defense manufacturing, particularly for applications involving drones, missiles, ammunition, aircraft structures, propulsion systems, turbine blades, and other safety-critical assemblies. Detection Technology's X-Panel XL series combines large-area imaging, high-speed acquisition, and high-energy imaging capabilities to support inspection workflows in demanding production environments.
According to the company, the series utilizes large-area imaging, high frame rates, and single-glass amorphous silicon TFT technology to help manufacturers improve inspection efficiency and increase system throughput without compromising quality requirements.
“Across the defense industry, production volumes are increasing while quality requirements remain uncompromising. Manufacturers are looking for inspection solutions that can scale with production without sacrificing reliability,” said Juha Talasmäki, Vice President, Business Development at Detection Technology.
“Historically, 100% quality assurance has often been time-consuming due to inspection throughput limitations. Advances in X-ray imaging now enable efficient inspection of significantly larger volumes of critical components. For example, five 155 mm artillery shells can be seamlessly inspected in a single scan.”
The throughput capabilities of large-area detector technology have also been demonstrated through collaboration with Fraunhofer IIS, a research organization focused on applied technologies. Detection Technology noted that Fraunhofer’s PolyCT technology enables the simultaneous scanning of multiple objects, while the X-Panel 43108a detector provides the imaging area required for efficient multi-object computed tomography (CT) acquisition.
Michael Salamon, Group Manager, High-Energy X-ray Systems at Fraunhofer IIS, commented: “We placed our PolyCT rotation stage in front of DT’s X-Panel 43108a detector to scan five objects simultaneously. We achieved excellent CT results in the shortest possible time while maximizing the throughput of our high-energy CT system. Combined with downstream automated evaluation routines, this is a real game-changer for industrial CT.”
The X-Panel XL portfolio currently includes the X-Panel 43108a and the recently introduced X-Panel 4386a detector solutions. Depending on system configuration, the detectors support X-ray tube applications up to 750 kVp and linear accelerator applications up to 16 MV. Additional features include high-speed 10G Ethernet connectivity, multiple scintillator options, and frame rates of up to 90 frames per second, supporting industrial CT and digital radiography (DR) applications where image quality, throughput, and operational reliability are critical.
Detection Technology stated that the X-Panel XL series complies with relevant international industry, safety, and environmental standards, supporting streamlined system integration and certification processes. Deliveries of EU-origin X-Panel XL systems are scheduled to begin during the second half of 2026.
The company is showcasing the X-Panel XL series alongside Fraunhofer IIS’s PolyCT system concept at the European Conference on Non-Destructive Testing (ECNDT) 2026, taking place in Verona, Italy, from June 15–19, where visitors can meet Detection Technology at Stand 140–141.
