The latest in XRF coatings analysis equipment
Using advanced XRF technology to measure features smaller than 50 µm
As electronics components, including semiconductors and micro-electronics, continue miniaturizing and becoming increasingly sophisticated, so must the tools used for analyzing them.
In this webinar, you will learn about:
- Using advanced XRF technology to measure features smaller than 50 µm
- Simplifying the most challenging aspect of XRF analysis – sample positioning
- Using polycapillary optics to help reduce costs from chemical usage
