Infrared Lock-in Thermography for Inspection of Electronics and Integrated Circuits
Active thermography has become a trusted method for troubleshooting and ensuring quality in electronic components and assemblies, from early prototype development to full-scale production.
Exploring Active Thermography for Electronics Inspection
Active thermography has become a trusted method for troubleshooting and ensuring quality in electronic components and assemblies, from early prototype development to full-scale production. Among its techniques, lock-in thermography stands out for providing highly detailed insights at every stage of development. These insights are invaluable for designing complex electronic circuits and assemblies, particularly for optimizing thermal management.
In electronics manufacturing, active thermography proves to be a versatile tool. It plays a key role in quality assurance, continuous monitoring of technological parameters, and inline product inspection.
What to Expect from the Webinar:
- In-depth exploration of failure analysis and defect inspection
- Insights into quality and process control
- Flexible R&D solutions tailored to various needs
- Configurations ranging from basic setups to turnkey solutions
- Hotspot detection on printed circuit boards, integrated circuits, semiconductor materials, and multi-chip modules
- Identification of issues such as faulty thermal connections, short circuits, soldering defects, and wire bonding errors
This webinar offers a valuable opportunity to learn about the capabilities of active thermography in enhancing electronics inspection and quality assurance.
