Expanding the Boundaries of X-Ray CT: Imaging at Sub-Micron Resolution
Expanding the Boundaries of X-Ray CT: Imaging at Sub-Micron Resolution
Resolution is a typical limitation of traditional X-ray computed tomography (CT) systems for scanning large samples, but this is not a limiting factor for X-ray microscopes that use Resolution at a Distance (RaaD). With a true spatial resolution of 500 nm and a minimum achievable voxel size of 40 nm, high-resolution X-ray imaging can be used as an inspection tool on a wide range of sample types, sizes, and compositions to measure, analyze, and inspect interior structures and hidden features nondestructively. This unique capability is, more and more, of interest to the quality control industry as manufacturers grapple with small features in high-precision manufactured parts.
Attend this webinar and learn how to:
- Combine high-resolution X-ray imaging and nondestructive 3D computed tomography.
- Nondestructively inspect the design of a part’s complex internal and external features.
- Reveal the smallest internal structure of objects at sub-micrometer resolution.
- Collect high-resolution images from diverse sample types—even for large samples.
CONTRIBUTORS
Herminso Villarraga-Gómez, Ph.D.
Herminso Villarraga-Gómez is an X-ray Quality Solutions Manager at ZEISS Industrial Quality Solutions. He specializes in industrial applications of X-ray computed tomography working in dimensional metrology, 3D X-ray imaging/microscopy, and nondestructive evaluation. Herminso holds a Ph.D. in Optical Science and Engineering (University of North Carolina at Charlotte). His current interests include establishing the accuracy and precision of 3D X-ray measurement technologies and in comparing its performance with other existing measuring techniques, e.g., tactile coordinate measurement machines. He is also interested in advancing new manufacturing technologies such as additive manufacturing and contributing to the industry of quality control and nondestructive evaluation. Herminso is the author of several peer-reviewed articles, conference papers, and a book chapter. He is a member of the American Society for Precision Engineering (ASPE), the American Society of Nondestructive Testing (ASNT), the International societies for optics and photonics SPIE and OSA, the Society of Manufacturing Engineers (SME), and other professional associations promoting the advancement of engineering and applied physics.
