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Expanding the Boundaries of X-Ray CT: Imaging at Sub-Micron Resolution

Expanding the Boundaries of X-Ray CT: Imaging at Sub-Micron Resolution

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Resolution is a typical limitation of traditional X-ray computed tomography (CT) systems for scanning large samples, but this is not a limiting factor for X-ray microscopes that use Resolution at a Distance (RaaD). With a true spatial resolution of 500 nm and a minimum achievable voxel size of 40 nm, high-resolution X-ray imaging can be used as an inspection tool on a wide range of sample types, sizes, and compositions to measure, analyze, and inspect interior structures and hidden features nondestructively. This unique capability is, more and more, of interest to the quality control industry as manufacturers grapple with small features in high-precision manufactured parts.

Attend this webinar and learn how to:

  • Combine high-resolution X-ray imaging and nondestructive 3D computed tomography.
  • Nondestructively inspect the design of a part’s complex internal and external features.
  • Reveal the smallest internal structure of objects at sub-micrometer resolution.
  • Collect high-resolution images from diverse sample types—even for large samples.


Herminso Villarraga-Gómez, Ph.D.

Herminso Villarraga-Gómez is an X-ray Quality Solutions Manager at ZEISS Industrial Quality Solutions. He specializes in industrial applications of X-ray computed tomography working in dimensional metrology, 3D X-ray imaging/microscopy, and nondestructive evaluation. Herminso holds a Ph.D. in Optical Science and Engineering (University of North Carolina at Charlotte). His current interests include establishing the accuracy and precision of 3D X-ray measurement technologies and in comparing its performance with other existing measuring techniques, e.g., tactile coordinate measurement machines. He is also interested in advancing new manufacturing technologies such as additive manufacturing and contributing to the industry of quality control and nondestructive evaluation. Herminso is the author of several peer-reviewed articles, conference papers, and a book chapter. He is a member of the American Society for Precision Engineering (ASPE), the American Society of Nondestructive Testing (ASNT), the International societies for optics and photonics SPIE and OSA, the Society of Manufacturing Engineers (SME), and other professional associations promoting the advancement of engineering and applied physics.

About American Society for Nondestructive Testing

The American Society for Nondestructive Testing, Inc. (ASNT) is the world's largest technical society for nondestructive testing (NDT) professionals. Through our organization and membership, we provide a forum for exchange of NDT technical information; NDT educational materials and programs; and standards and services for the qualification and certification of NDT personnel. ASNT promotes the discipline of NDT as a profession and facilitates NDT research and technology applications. 

ASNT Mission Statement

ASNT exists to create a safer world by advancing scientific, engineering, and technical knowledge in the field of nondestructive testing.™

 ASNT Strategic Objectives

  1. Increase participation in society’s activities.
  2. Promote an inclusive vision across ASNT’s membership and the NDT community.
  3. Be a premier provider of NDT/NDI/NDE/NDC information including publications, references, archives, training and conferences.
  4. Support national and international acceptance and use of ASNT’s services.
  5. Promote advancement of research and implementation of NDE technology.
  6. Grow ASNT through partnership with industry, government, professional organizations and educational institutions.
  7. Advocate and provide NDT personnel certification.
  8. Maintain ASNT’s fiscal stability in order to fulfill the society’s mission.
  9. ASNT will identify paths for lifelong education and career development within the NDT profession including theory, application and skills for the practitioner, engineer and researcher.
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Application Notes