Confidence You Can See—Introducing the OmniScan™ X3 PAUT/TFM Flaw Detector

Confidence You Can See—Introducing the OmniScan™ X3 PAUT/TFM Flaw Detector

Get an overview, including a live demo, of the new OmniScan flaw detector’s innovative TFM imaging, improved phased array inspection, streamlined TOFD menu, and other enhancements. The session is approximately 1 hour.

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Presenter:
Tommy Bourgelas, Senior Product Manager—OmniScan Product Line
Olympus Scientific Solutions Americas (OSSA)