A New Angle of CT Inspection for Challenging Components
Join Nikon's webinar on Thursday, May 2nd, to learn about a new and innovative X-ray computed tomography scanning approach called Tilted CT.
We all know small, round, low-density components are great for X-ray CT, but what do you do when the samples are not so X-ray CT-friendly?
How do you still achieve quality, high-resolution scan results on products such as large circuit boards or other planar, flat, and high aspect ratio components?
Join Nikon's webinar on Thursday, May 2nd, to learn about a new and innovative X-ray computed tomography scanning approach called Tilted CT.
This method can increase magnification and resolution while reducing artifacts when imaging challenging components.
In this webinar, they will explain how Tilted CT utilizes proven laminography principles using an angled axis of rotation to achieve superior results over Traditional Circular CT. They will showcase scan applications demonstrating how Tilted CT can help users discover more details with greater confidence.
