Stresstech
For more than 30 years, Stresstech has been providing non-destructive and destructive testing solutions for process control and quality inspection.
Service
Finland
Overview
For more than 30 years, Stresstech has been providing non-destructive and destructive testing solutions for process control and quality inspection. Stresstech is headquartered in Finland and has offices in Germany, the United States, and India, as well as sales and service representatives around the world.
Roboscan measurement adjustment with user
Mission
Stresstech’s mission is to serve the quality control and material research needs of the manufacturing industry, research institutes and universities by providing testing equipment and knowledge. We have the knowledge and experience of our technologies all under one roof, from basic science to production. Our team of experts is committed to innovate, develop, and manufacture turnkey systems for:
residual stress measurement
heat treatment verification
grinding burn detection
Vision
Stresstech’s vision is to ensure that the manufactured components are sustainable, reliable, and safe. Our vision is to develop science-based quality control solutions so simple and effective that every manufacturer within our target market industries are willing to use one.
Customer value statement
With Stresstech solutions, you can improve and control the quality of your manufacturing processes, that can affect material properties.
Products & Services
X-ray Diffraction
Residual stresses can be measured non-destructively with X-ray diffraction method. X-ray diffraction provides reliable and objective data for quality control assessment. X-rays have high energy and short wavelength when compared to visible light making them ideal for probing the interplanar distances in crystalline materials.
X-rays were discovered by German Physicist W. C. Röntgen in 1895. X-rays are electromagnetic radiation having a much shorter wavelength than visible light and therefore are more energetic. Using this additional energy of these “soft” X-rays, we can probe the inter-atomic distance in crystalline materials at a depth of 1-10’s of microns into the surface. Assuming a planar stress state and using the inter-atomic spacing as the ultimate gage length allows us to measure absolute stress without the need for unstressed samples for calibration.
Barkhausen Noise Analysis
Barkhausen noise analysis is a non-destructive method involving the measurement of a noise like signal induced in a ferromagnetic material by an applied magnetic field.
There are two main material characteristics that will directly affect the intensity of the Barkhausen noise signal: hardness and stress.
The nature of Barkhausen noise was first described in 1919 by Prof. Heinrich Barkhausen. However, the method gained attention for industrial applications in the early 1980s from Dr. Seppo Tiitto and Dr. Kirsti Tiitto, the founders of Stresstech. Today, it is a recognized non-destructive method for materials characterization and heat treatment defect testing.
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