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IMG Ultrasuoni Srl.

IMG Ultrasuoni was founded in 1983 as a manufacturer of ultrasonic transducers for industrial applications, also called "NDT - Non-Destructive Testing" and medical applications (Doppler effect).

Product, Service

Italy

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Overview

For over 35 years we have specialized in the production and sale of products to carry out Non-Destructive Testing using ultrasound (NDT), induced currents and liquid penetrants, as well as via magnetoscopy and visual testing. All cutting-edge solutions for Non-Destructive Testing The experience gained in the sector and the very high specialization of the technicians who work daily to improve our services have allowed us to become national points of reference in the supply of complete and automated solutions for carrying out non-destructive testing (NDT) Ultrasonic and induced current instruments for non-destructive testing (NDT) of materials Ultrasonic and induced current probes and transducers with related accessories Sample blocks Sockets for probes Cables The idea behind our activity, and the reason why after 35 years customers still turn to us to purchase products for their non-destructive testing is quality and respect for the customer. We are constantly looking for new products on the market that can guarantee the performance we are looking for but not only that: we produce instruments that have passed the most demanding and qualifying tests. Official and exclusive Eddyfi resellers The company operates independently from the study, design and production of ultrasound probes and transducers and special systems for non-destructive testing (NDT), offering the customer a complete and reliable solution. We are exclusive resellers in Italy for EddyFi, the world leader in the production of instruments for electromagnetic, ultrasonic, penetrating, visual and radiographic inspections.

Products & Services
ANGLED PROBES STA 14X14 angled probes

Description:

Angled transverse wave probes with 14×14 crystal for manual contact checks, examining

welds and searching for defects. They are available with frequencies from 1MHz to 4MHz with piezo-composite or standard crystal. 

Characteristics:

Angled transverse wave probes with 14×14 crystal for manual contact checks, examining welds and searching for defects. They are available with frequencies from 1MHz to 4MHz with piezo-composite or standard crystal. Each probe is accompanied by a characterization certificate (FFT) and, upon request, a technical data sheet. On request, it is possible to create probes with crystal, external dimensions, frequency and damping according to customer specifications.

DOUBLE ANGLED PROBES FROM/DAT

Description:

Angled double crystal probes with Longitudinal waves (DAL) or Transversal waves (DAT) are suitable for checking low thicknesses or searching for nearby defects. 

Characteristics:

Angled double crystal probes with Longitudinal waves (DAL) or Transversal waves (DAT) are suitable for checking low thicknesses or searching for nearby defects. The DAL and DAT models are supplied with a standard focal length as per the table or with a beam focusing depth defined by the customer. Each probe is accompanied by a characterization certificate (FFT) and, upon request, a technical data sheet. On request, it is possible to create probes with crystal, external dimensions, frequency and damping according to customer specifications.

DOUBLE ANGLED PROBES DOUBLE ANGLED LFI/SCR30

Description:

Complete series of LFI and SCR probes with 10×18 (LFI) and 6×18 (SCR) crystal sizes. Both models are available with frequencies from 1 to 4 MHz. The LFI probes are available with angles of 45, 60, and 70 and with standard focal lengths of 60, 40 and 20mm. The SCR model probes have a 15mm focal length.

Characteristics:

Complete series of LFI and SCR probes with 10×18 (LFI) and 6×18 (SCR) crystal sizes. Both models are available with frequencies from 1 to 4 MHz.

The LFI probes are available with angles of 45, 60, and 70 and with standard focal lengths of 60, 40 and 20mm. The SCR model probes have a 15mm focal length. Different angles and focal lengths are available on request. The probes can be made with piezocomposite crystal and each probe comes with a characterization certificate and technical data sheet and, upon request, a focus and angle diagram.

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