Hitachi High-Tech Analytical Science
Hitachi High-Tech Analytical Science provides benchtop, portable and handheld x-ray fluorescence XRF analysers, laser induced spectrometers (LIBS) and optical emission spectrometers (OES) to industrial customers for a wide range of applications.
Product
United Kingdom
Overview
- Oil and gas upstream: Material verification of metal components on and offshore. Instant results of material grade and chemistry.
- Oil and gas midstream: Pipeline safety verification with reliable, fast and comprehensive chemistry measurements.
- Oil and gas downstream: Complete PMI for components before, during and at end-of-life, including weld integrity.
- Power: Complete PMI for components that must meet ASME Section IX B&PV code standards and flow accelerated corrosion (FAC) analysis.
- All plants: Verifying materials for weldability, providing a library of carbon equivalent and other formulas. High temperature testing capability for reduced downtime.
Why choose Hitachi High-Tech Analytical Science?
We specialize in high-tech analysis solutions, designed to meet the tough challenges of a rapidly evolving industrial sector. Today, we’re helping thousands of businesses streamline their costs, minimize risk and increase production efficiency.
Our range of laboratory-based and robust high-performance in-field testing instruments deliver materials and coatings analysis that adds value throughout the production lifecycle, from raw material exploration to incoming inspection, production and quality control to recycling.
Working in close collaboration with our customers, our in-house experts have developed customised testing methodologies for hundreds of industrial applications, delivering simplicity of operation for even the most demanding applications.
Transforming the latest technological advances into analysis solutions that drive business success.
Products & Services
Benchtop microspot XRF analyzers | FT, EA6000VX and X-Strata ranges
Microspot XRF coating thickness and materials analyzers for rapid quality control and validation testing, making it easy to get the right results in seconds.
Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique, offering easy-to-use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analysing solids or liquids over a wide element range from 13Al to 92U on the periodic table.
X-Strata920
- Proportional counter or high resolution SDD
- Element range: Ti – U or Al – U (SDD)
- Chamber design : slotted
- XY stage options : fixed base, deep well, motorised
- Largest sample : 270 x 500 x 150 mm
- Maximum number of collimators : 6
- Filters : 1
- Smallest collimator : 0.01 x 0.25 mm (0.5 x10 mil)
- SmartLink software
FT110A
- Proportional Counter System
- Element range : Ti - U
- Chamber design : closed or slotted
- XY stage options : fixed base, motorised
- Largest sample : 500 x 400 x 150 mm
- Maximum number of collimators : 4
- Filters: Primary 1, Secondary (Option) 1
- Smallest collimator : 0.05 mm
- X-ray Station software