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Hitachi High-Tech Analytical Science

Hitachi High-Tech Analytical Science provides benchtop, portable and handheld x-ray fluorescence XRF analysers, laser induced spectrometers (LIBS) and optical emission spectrometers (OES) to industrial customers for a wide range of applications.

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United Kingdom

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Overview
Hitachi High-Tech Analytical Science is a global company created in July 2017 within the Hitachi High Technologies Group.  Hitachi High-Tech Analytical Science has put years of experience of practical analysis into the development of a range of analyzers for PMI/NDT use across large-scale industrial processing plants. With a focus on robustness, ease of use and accuracy, you can take Hitachi PMI analyzers to every corner of your plant, including hard-to-reach test locations and welds.

Main Applications

Our analyzers are suitable for oil and gas plants, power plants and chemical processing facilities – and have a wide range of applications. The most common are:
  • Oil and gas upstream: Material verification of metal components on and offshore. Instant results of material grade and chemistry.
  • Oil and gas midstream: Pipeline safety verification with reliable, fast and comprehensive chemistry measurements.
  • Oil and gas downstream: Complete PMI for components before, during and at end-of-life, including weld integrity.
  • Power: Complete PMI for components that must meet ASME Section IX B&PV code standards and flow accelerated corrosion (FAC) analysis.
  • All plants: Verifying materials for weldability, providing a library of carbon equivalent and other formulas. High temperature testing capability for reduced downtime.

Why choose Hitachi High-Tech Analytical Science?

We specialize in high-tech analysis solutions, designed to meet the tough challenges of a rapidly evolving industrial sector. Today, we’re helping thousands of businesses streamline their costs, minimize risk and increase production efficiency. 

Our range of laboratory-based and robust high-performance in-field testing instruments deliver materials and coatings analysis that adds value throughout the production lifecycle, from raw material exploration to incoming inspection, production and quality control to recycling.

Working in close collaboration with our customers, our in-house experts have developed customised testing methodologies for hundreds of industrial applications, delivering simplicity of operation for even the most demanding applications.

Transforming the latest technological advances into analysis solutions that drive business success.

Products & Services
Benchtop microspot XRF analyzers | FT, EA6000VX and X-Strata ranges


Microspot XRF coating thickness and materials analyzers for rapid quality control and validation testing, making it easy to get the right results in seconds.

Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical technique, offering easy-to-use, fast and non-destructive analysis, requiring little to no sample preparation, capable of analysing solids or liquids over a wide element range from 13Al to 92U on the periodic table.


X-Strata920

  • Proportional counter or high resolution SDD
  • Element range: Ti – U or Al – U (SDD)
  • Chamber design : slotted
  • XY stage options : fixed base, deep well, motorised
  • Largest sample : 270 x 500 x 150 mm
  • Maximum number of collimators : 6
  • Filters : 1
  • Smallest collimator : 0.01 x 0.25 mm (0.5 x10 mil)
  • SmartLink software


FT110A

  • Proportional Counter System
  • Element range : Ti - U
  • Chamber design : closed or slotted
  • XY stage options : fixed base, motorised
  • Largest sample : 500 x 400 x 150 mm
  • Maximum number of collimators : 4
  • Filters: Primary 1, Secondary (Option) 1
  • Smallest collimator : 0.05 mm
  • X-ray Station software


EA6000VX

  • High resolution SDD
  • Element range : Mg - U (Na - U when using helium purge)
  • Chamber design : closed
  • XY stage options : motorised
  • Largest sample : 270 x 220 x 150 mm
  • Maximum number of collimators : 4
  • Filters : 6 mode automatic switching
  • Smallest collimator : 0.2mm
  • X-ray Station & Mapping Station software


FT160 Series

  • High Resolution SDD
  • Element range : Al - U
  • Chamber design : closed
  • XY stage options : motorised, wafer
  • Largest sample : 600 x 600 x 20 mm
  • Filters : 5
  • Polycapillary optic spot size < 30 µm
  • XRF Controller software



Benchtop XRF analyzers for RoHS | EA1000AIII, EA1000VX and EA6000

Specifically designed for RoHS (Restriction of Hazardous Substances) the EA1000AIII, EA1000VX and EA6000 XRF analyzers have been trusted for over 15 years to deliver consistent results for businesses who need to conform to this directive. With easy and quick measurement of hazardous substances you can ensure you will be able to meet the requirements for environmental regulations. Choose between the EA1000 range for dedicated RoHS analysis or the EA6000 for RoHS, coatings and elemental mapping analysis.

Why choose Hitachi XRF RoHS analyzers?

  •  Easy to operate
  • Automatic sampling
  • Flexible calibrations to adapt to new RoHS standards
  • Automatically highlights what you’re analyzing for glanceable results
  • Quick measurement
  • Large chamber to fit a variety of samples
  • Visual and audio measurement indicator
  • Option to add coatings and elemental analysis

Product Comparison


EA1000AIII

  • Detector: Si semiconductor detector (No liquid nitrogen required)
  • Measurement time* Cd, Pb, Hg, Br, Cr in plastics: Less than 70 sec
  • Measurement time* Cd, Pb, Hg, Cr in high concentration BrSb plastics : Less than 230 sec
  • Element range: Al (13) to U (92)
  • Sample state: Solid / Powder / Liquid
  • Measurement area: 1 mmφ、3 mmφ、5 mmφ(Electric switching)
  • Sample chamber: W370 x D320 x H120 mm
  • Filter: 5 positions
  • Sample observation: CCD camera full color
  • Operation: Laptop of desktop PC


EA1000VX

  • Detector: Vortex® SDD (No liquid nitrogen required)
  • Measurement time* Cd, Pb, Hg, Br, Cr in plastics: Less than 35 sec
  • Measurement time* Cd, Pb, Hg, Cr in high concentration BrSb plastics: Less than 140 sec
  • Element range: Al (13) to U (92)
  • Sample state: Solid / Powder / Liquid
  • Measurement area: 1 mmφ、3 mmφ、5 mmφ(Electric switching)
  • Sample chamber: W370 x D320 x H120 mm
  • Filter: 5 positions
  • Sample observation: CCD camera full color
  • Operation: Laptop of desktop PC


EA6000VX

  • High resolution SDD
  • Element range : Mg - U (Na - U when using helium purge)
  • Chamber design : closed
  • XY stage options : motorised
  • Largest sample : 270 x 220 x 150 mm
  • Maximum number of collimators : 4
  • Filters : 6 mode automatic switching
  • Smallest collimator : 0.2mm
  • X-ray Station & Mapping Station software
Benchtop XRF elemental analysis | LAB-X and X-Supreme ranges


XRF analysis (X-ray fluorescence) with the highly flexible and powerful energy-dispersive X-ray fluorescence (EDXRF) spectrometer X-Supreme8000 and LAB-X5000 for quality assurance and process control requirements across a diverse range of applications; e.g. Petroleum & oil, wood treatment, minerals, mining, cosmetics, Cement, paper.

Why choose Hitachi benchtop XRF analyzers?

  • Results you can trust

An integrated sample spinner rotates the sample during the measurement, ensuring results are repeatable, even for inhomogeneous samples such as powders.

User error is minimized: the analyzer is easy to use with a simple one-button start, intuitive user interface and a large, easy to read display.

  • Fast quality control

Rapid analysis means that our analyzers can be used at any stage of production for quick feedback on materials composition and quality.

  • Ruggedness built in

An automated turntable moves the sample away from key analyzer components to minimize the risk of damage and ensure low maintenance costs.

The analyzer is built with robust, field- proven components and an industrial grade PC. These features mean that the benchtop XRF range is tough enough to use in the harshest of production facilities.

  • Low running costs

Helium usage and costs are kept to a minimum - the majority of measurements can be taken in ambient air atmosphere.

Few consumables are needed and maintenance costs are extremely low, especially when compared to other methods, like ICP.

Compare Products 

Note 1 – only on selected configurations

ExTOPE Connect for LAB-X

  • Boost your operational efficiency with state of the art data management
  • ExTOPE connect is an advanced data management and storage service that allows you to store your results safely, share data instantly and access the data in real time from any computer.
  • Achieve greater efficiency in the field or production site when using Hitachi High-Tech’s Vulcan, X-MET or Lab-X5000 analyzers.
  • ExTOPE Connect - Advanced data management, sharing and storage for LAB-X.
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