CM 2020 Conference: Registration is now Open

By: Publisher Team | Feb 18, 2020 14:05 PM

Registration is now open for the Seventeenth International Conference on Condition Monitoring and Asset Management (CM 2020),taking place from Tuesday 30 June to Thursday 2 July 2020 at the Park Inn by Radisson Hotel and Conference Centre, London Heathrow, UK. The theme for CM 2020 will be: ‘The future of condition monitoring’.

Register online before 15 May 2020 to receive the early registration discount. Further discounts are available for members, speakers, structured session organisers and in-kind sponsors. For further information and to register visit:  2020 will provide attendees with a unique opportunity to network with academics and industrialists from all over the world. Leading figures in the fields of CM and asset management will be presenting at the conference, with the very latest developments in these areas being revealed, ensuring all attendees will learn something.

There will be four sessions running in parallel covering a wide range of advances in CM fields, which will include:
• Plenary presentations
• Invited and contributed presentations, including case study presentations
• Industrial sessions for major industrial sectors
• Expert panel session on hot topics in CM, led by recognised scientists and engineers
• Exhibition, vendor presentations and plenary spotlight session for exhibitors and sponsors
• Social events
• BINDT-sponsored student packages
• Free-of-charge workshop for CM conference delegates.

A table-top exhibition of CM- and NDT-related products will run alongside the CM 2020 Conference, with the exhibition running for two days on Tuesday 30 June and Wednesday 1 July 2020. Exhibition space may be provisionally reserved and will be allocated on a ‘first-come, first-served’ basis. Exhibitors will have the opportunity to meet delegates from all over the world and display their equipment and services to them all, as well as giving a short sales talk in the plenary lecture room to all conference delegates during the exhibition open period. Attendance at the exhibition is FREE of charge to visitors. To download an exhibitor booking form,
visit: Exhibitor Booking e-Form.pdf.  
For further information about exhibiting email:

Call for Travel and Attendance Award applicants
If you are based overseas and from the CM/NDT profession, but are unable to attend due to financial constraints, you may be eligible for the BINDT Travel and Attendance Award. Applicants can range from individuals at an early career stage to experienced contributors. To view the eligibility criteria and details on how to apply, visit:

Student registration
BINDT has always recognised the importance of encouraging students to participate in this major international event. As a gesture to celebrate the seventeenth international conference, the Institute will be providing sponsorship of student registrations in 2020, resulting in a major reduction of fees for student attendance. In addition, the ‘Best Student Paper Award’ is intended to encourage students and people in the early stages of their careers (first five years) in the field of CM to present their work.

Abstract and full paper submission
The deadline for the submission of abstracts (of no more than 200 words) is 31 January 2020, with the deadline for submitting full-length papers being 17 April 2020. To submit abstracts and papers, visit:

Further information about this prestigious event can be found at:

Follow this event on Twitter @CM_MFPT


Notes for editors

The British Institute of Non-Destructive Testing (BINDT) is a UK-based professional engineering institutionworking to promote the advancement ofthe science and practice of non-destructive testing (NDT), condition monitoring (CM), diagnostic engineering and all other materials and quality testing disciplines. Internationally recognised, it is concerned withthe education, training and certification of its members and all those engaged in NDT and CM and through its publications and annual conferences and eventsit disseminates news of the latest advances in the science and practice of the subjects.For further information about the Institute and its activities, visit

What are NDT and CM?
Non-destructive testing is the branch of engineering concerned with all methods of detecting and evaluating flaws in materials. Flaws can affect the serviceability of a material or structure, so NDT is important in guaranteeing safe operation as well as in quality control and assessing plant life. The flaws may be cracks or inclusions in welds and castings or variations in structural properties, which can lead to a loss of strength or failure in service. The essential feature of NDT is that the test process itself produces no
deleterious effects on the material or structure under test. The subject of NDT has no clearly defined boundaries; it ranges from simple techniques such as the visual examination of surfaces, through the well-established methods of radiography, ultrasonic testing and magnetic particle crack detection, to new and very specialised methods such as the measurement of Barkhausen noise and positron annihilation spectroscopy.

Condition monitoring (CM) aims to ensure plant efficiency, productivity and reliability by monitoring and analysing the wear of operating machinery and components to provide an early warning of impending failure, thereby reducing costly plant shutdown. Condition monitoring originally used mainly vibration and tribology analysis techniques but now encompasses new fields such as thermal imaging, acoustic emission and other non-destructive techniques. The diagnostic and prognostic elements, in addition to increasingly sophisticated signal processing, is using trends from repeated measurements in time intervals of days and weeks.

Contact for press enquiries and image requests:
Sharon Creed
Marketing & PR Manager
The British Institute of Non-Destructive Testing
Midsummer House, Riverside Way, Bedford Road
Northampton NN1 5NX, UK
Tel: +44 (0)1604 438300
Fax: +44 (0)1604 438301